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Work hardening behavior of aluminum over a wide range of strain

Chinh, N.Q., Voros, G., Horita, Z. and Langdon, T.G. (2002) Work hardening behavior of aluminum over a wide range of strain In, Zhu, Y.T., Langdon, T.G., Mishra, R.S., Semiatin, S.L., Saran, M.J. and Lowe, T.C. (eds.) Ultrafine Grained Materials II. 2002 TMS Annual Meeting and Exhibition Minerals, Metals & Materials Society pp. 567-574.

Record type: Book Section

Abstract

The work hardening behavior of high purity (4N) aluminum was investigated over a wide range of strain. The true stress-true strain curves of both annealed and equal-channel angular pressed (ECAP) Al samples were analyzed mathematically after deformation in tensile and compression tests. In this analysis, the absolute strain calculated from the annealed state was used where the annealed state relates to zero strain and the ECAP samples have an imposed strain before subsequent deformation in tensile or compression testing. The results show that in the range of low strains, as in the deformation of annealed samples, the rate of hardening is always positive and the magnitude of the hardening rate decreases monotonously with the total strain. In the range of high strains, as in the samples subjected to ECAP, the yield stress saturates because a homogeneous microstructure is ultimately established through ECAP processing.

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More information

Published date: 2002
Venue - Dates: 2002 TMS Annual Meeting and Exhibition, 2002-02-17 - 2002-02-21
Keywords: aluminum, equal-channel angular pressing, stress-strain behavior, work hardening

Identifiers

Local EPrints ID: 23858
URI: http://eprints.soton.ac.uk/id/eprint/23858
ISBN: 0-87339-523-9
PURE UUID: 60fe6d7b-ac8a-4fe7-99a6-255a69d524e4
ORCID for T.G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

Catalogue record

Date deposited: 05 Apr 2006
Last modified: 17 Jul 2017 16:16

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Contributors

Author: N.Q. Chinh
Author: G. Voros
Author: Z. Horita
Author: T.G. Langdon ORCID iD
Editor: Y.T. Zhu
Editor: T.G. Langdon
Editor: R.S. Mishra
Editor: S.L. Semiatin
Editor: M.J. Saran
Editor: T.C. Lowe

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