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Path algebras for CMOS circuit testing

Record type: Article

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Citation

Damper, R.I. and Burgess, N. (1990) Path algebras for CMOS circuit testing Facta Universitatis, Series: Electronics and Energetics, University of Nis, Yugoslavia, 3, pp. 47-54.

More information

Published date: 1990
Organisations: Southampton Wireless Group

Identifiers

Local EPrints ID: 250289
URI: http://eprints.soton.ac.uk/id/eprint/250289
PURE UUID: 6f421907-a7eb-444c-a427-d50d0b7eb1f0

Catalogue record

Date deposited: 28 May 1999
Last modified: 18 Jul 2017 10:43

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Contributors

Author: R.I. Damper
Author: N. Burgess

University divisions


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