New time-of-flight technique for measuring drift velocity in Semiconductors


Evans, A G R, Robson, P N and Stubbs, M G (1972) New time-of-flight technique for measuring drift velocity in Semiconductors

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Item Type: Other
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 250984
Date :
Date Event
1972Published
Date Deposited: 08 Oct 1999
Last Modified: 17 Apr 2017 23:46
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/250984

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