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New time-of-flight technique for measuring drift velocity in Semiconductors

Record type: Other

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Citation

Evans, A G R, Robson, P N and Stubbs, M G (1972) New time-of-flight technique for measuring drift velocity in Semiconductors

More information

Published date: 1972
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 250984
URI: http://eprints.soton.ac.uk/id/eprint/250984
PURE UUID: fcfa1899-ffcd-4983-b5a8-2935087f6a1f

Catalogue record

Date deposited: 08 Oct 1999
Last modified: 18 Jul 2017 10:13

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Contributors

Author: A G R Evans
Author: P N Robson
Author: M G Stubbs

University divisions


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