Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques
Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Robson, P N
9e62149c-0dba-4126-91f1-e5528c9d673c
1974
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Robson, P N
9e62149c-0dba-4126-91f1-e5528c9d673c
Evans, A G R and Robson, P N
(1974)
Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques.
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Published date: 1974
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 250985
URI: http://eprints.soton.ac.uk/id/eprint/250985
PURE UUID: 44c3a621-70d7-4cb0-ad67-f12abf023c35
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Date deposited: 08 Oct 1999
Last modified: 10 Dec 2021 20:19
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Contributors
Author:
A G R Evans
Author:
P N Robson
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