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Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques

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Citation

Evans, A G R and Robson, P N (1974) Drift mobility measurement in thin epitaxial semiconductor layers using time-of-flight techniques

More information

Published date: 1974
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 250985
URI: http://eprints.soton.ac.uk/id/eprint/250985
PURE UUID: 44c3a621-70d7-4cb0-ad67-f12abf023c35

Catalogue record

Date deposited: 08 Oct 1999
Last modified: 18 Jul 2017 10:13

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Contributors

Author: A G R Evans
Author: P N Robson

University divisions


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