Increase of low frequency noise generating defects in todays CMOS/BICOM technologies


Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Carter, J C and Redman-White, W (1989) Increase of low frequency noise generating defects in todays CMOS/BICOM technologies

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Item Type: Other
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 251019
Date :
Date Event
1989Published
Date Deposited: 11 Oct 1999
Last Modified: 17 Apr 2017 23:46
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251019

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