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Increase of low frequency noise generating defects in todays CMOS/BICOM technologies

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Citation

Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Carter, J C and Redman-White, W (1989) Increase of low frequency noise generating defects in todays CMOS/BICOM technologies

More information

Published date: 1989
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 251019
URI: http://eprints.soton.ac.uk/id/eprint/251019
PURE UUID: 8f281e15-78e7-47a8-afed-dc1c92ba24fb

Catalogue record

Date deposited: 11 Oct 1999
Last modified: 18 Jul 2017 10:13

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Contributors

Author: D C Murray
Author: N Siabi-Shahrivar
Author: A G R Evans
Author: J C Carter
Author: W Redman-White

University divisions


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