Murray, D C, Evans, A G R and Carter, J C (1991) Shallow defects responsible for G-R noise in MOSFETS.
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More information
Published date: 1991
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 251030
URI: http://eprints.soton.ac.uk/id/eprint/251030
PURE UUID: 52bc3f85-f97c-4fe4-846a-f4de31c9fb22
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Date deposited: 11 Oct 1999
Last modified: 10 Dec 2021 20:19
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Contributors
Author:
D C Murray
Author:
A G R Evans
Author:
J C Carter
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