Shallow defects responsible for G-R noise in MOSFETS


Murray, D C, Evans, A G R and Carter, J C (1991) Shallow defects responsible for G-R noise in MOSFETS

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Item Type: Other
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 251030
Date :
Date Event
1991Published
Date Deposited: 11 Oct 1999
Last Modified: 17 Apr 2017 23:46
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251030

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