Siabi-Shahrivar, N, Redman-White, W, Ashburn, P and Post, I (1990) Modelling and characterisation of noise of polysilicon emitter bipolar transistors.
Record type:
Conference or Workshop Item
(Other)
This record has no associated files available for download.
More information
Published date: September 1990
Additional Information:
Organisation: IEEE Bipolar Circuits and Technology Meeting, Minneapolis, USA
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 251200
URI: http://eprints.soton.ac.uk/id/eprint/251200
PURE UUID: 119ecf53-caa8-4109-a5fe-d56128080a96
Catalogue record
Date deposited: 19 Oct 1999
Last modified: 12 Dec 2021 06:38
Export record
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.