Electrical method for measuring the emitter depth of shallow bipolar transistors


Post, IRC and Ashburn, P (1990) Electrical method for measuring the emitter depth of shallow bipolar transistors

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Item Type: Other
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 251831
Date :
Date Event
1990Published
Date Deposited: 09 Nov 1999
Last Modified: 17 Apr 2017 23:40
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251831

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