Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits

Chalk, C., Zwolinski, M. and Wilkins, B.R. (1997) Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits.

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More information

Published date: 1997

Additional Information: 3rd IEEE International Mixed Signal Testing Workshop

Organisations: EEE

Local EPrints ID: 251844

URI: http://eprints.soton.ac.uk/id/eprint/251844

PURE UUID: 76c6f456-de31-4950-891e-ca7d1142dc8a

ORCID for M. Zwolinski:

orcid.org/0000-0002-2230-625X

Date deposited: 12 Nov 1999

Last modified: 11 Dec 2021 02:43

Author: C. Chalk

Author: M. Zwolinski

Author: B.R. Wilkins

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