Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits


Chalk, C., Zwolinski, M. and Wilkins, B.R. (1997) Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits

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Item Type: Other
Additional Information: 3rd IEEE International Mixed Signal Testing Workshop
Organisations: EEE
ePrint ID: 251844
Date :
Date Event
1997Published
Date Deposited: 12 Nov 1999
Last Modified: 17 Apr 2017 23:40
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251844

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