Fast, robust DC and transient fault simulation for nonlinear analogue circuits

Yang, Z.R. and Zwolinski, M. (1999) Fast, robust DC and transient fault simulation for nonlinear analogue circuits. pp. 244-8 .

Record type: Conference or Workshop Item (Other)

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Published date: 1999

Additional Information: Design Automation And Test In Europe Organisation: IEEE

Organisations: EEE

Local EPrints ID: 251855

URI: http://eprints.soton.ac.uk/id/eprint/251855

PURE UUID: 23364608-8bcc-4e01-9271-6e0ee1a54bd3

ORCID for M. Zwolinski:

orcid.org/0000-0002-2230-625X

Date deposited: 12 Nov 1999

Last modified: 15 Mar 2024 02:39

Author: Z.R. Yang

Author: M. Zwolinski

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