Wolstenholme, G, Jorgensen, N, Ashburn, P and Booker, G R (1987) An investigation of the thermal stability of the interfacial oxide in polysilicon emitter bipolar transistors using high resolution TEM.
Record type:
Other
This record has no associated files available for download.
More information
Published date: 1987
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 251865
URI: http://eprints.soton.ac.uk/id/eprint/251865
PURE UUID: 02b3cd3f-100a-4da6-8ce6-692eb0ceebad
Catalogue record
Date deposited: 15 Nov 1999
Last modified: 10 Dec 2021 20:23
Export record
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.