Ashburn, P and Bull, C J (1979) Observations of dislocations and junction irregularities in bipolar transistors using the EBIC mode of the SEM.
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Published date: 1979
Organisations:
Nanoelectronics and Nanotechnology
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Local EPrints ID: 252056
URI: http://eprints.soton.ac.uk/id/eprint/252056
PURE UUID: 4f1adfda-af18-4ed8-94e1-6832e875ec64
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Date deposited: 07 Dec 1999
Last modified: 10 Dec 2021 20:24
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