Observations of dislocations and junction irregularities in bipolar transistors using the EBIC mode of the SEM


Ashburn, P and Bull, C J (1979) Observations of dislocations and junction irregularities in bipolar transistors using the EBIC mode of the SEM

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Item Type: Other
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 252056
Date :
Date Event
1979Published
Date Deposited: 07 Dec 1999
Last Modified: 17 Apr 2017 23:38
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/252056

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