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Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies

Murray, D C, Siabi-Shahrivar, N, Carter, J C, Evans, A G R and Redman-White, W (1989) Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies

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Published date: June 1989
Additional Information: Address: Strasbourg
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252069
URI: http://eprints.soton.ac.uk/id/eprint/252069
PURE UUID: 0e4480c5-885f-4a7e-b3f2-a0d3b1474cb9

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Date deposited: 09 Dec 1999
Last modified: 18 Jul 2017 10:07

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Contributors

Author: D C Murray
Author: N Siabi-Shahrivar
Author: J C Carter
Author: A G R Evans
Author: W Redman-White

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