Murray, D C, Siabi-Shahrivar, N, Carter, J C, Evans, A G R and Redman-White, W (1989) Increase of low frequency noise generating defects in today's CMOS/BICMOS technologies.
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More information
Published date: June 1989
Additional Information:
Address: Strasbourg
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252069
URI: http://eprints.soton.ac.uk/id/eprint/252069
PURE UUID: 0e4480c5-885f-4a7e-b3f2-a0d3b1474cb9
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Date deposited: 09 Dec 1999
Last modified: 10 Dec 2021 20:24
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Contributors
Author:
D C Murray
Author:
N Siabi-Shahrivar
Author:
J C Carter
Author:
A G R Evans
Author:
W Redman-White
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