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An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS

An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS
An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS
Murray, D C
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Evans, A G R
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Altrip, J L
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Carter, J C
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Gougam, A
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Murray, D C
2bce70f8-76ce-4693-bd84-22f43561e746
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Altrip, J L
17142133-bd7b-47ec-8fe7-42d39fad5f2b
Carter, J C
6a4e2120-5d03-4621-9ebc-ba8901e40e7a
Gougam, A
32b017b7-2d53-464e-ab76-2c9884f591e3

Murray, D C, Evans, A G R, Altrip, J L, Carter, J C and Gougam, A (1989) An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS.

Record type: Other

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More information

Published date: September 1989
Additional Information: Address: Berlin
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252071
URI: https://eprints.soton.ac.uk/id/eprint/252071
PURE UUID: 1426ed44-83e4-41d4-bbfa-716846c976a8

Catalogue record

Date deposited: 09 Dec 1999
Last modified: 18 Jul 2017 10:07

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