An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS


Murray, D C, Evans, A G R, Altrip, J L, Carter, J C and Gougam, A (1989) An investigation into the effects of RTA processing on low frequency noise and other characteristics of CMOSFETS

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Item Type: Other
Additional Information: Address: Berlin
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 252071
Date :
Date Event
September 1989Published
Date Deposited: 09 Dec 1999
Last Modified: 17 Apr 2017 23:38
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/252071

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