Silicon cantilevers with integral tips for atomic force microscopy
Silicon cantilevers with integral tips for atomic force microscopy
Farooqui, M M
1c0f9c64-a0a1-4759-a5de-492f142547ae
Leong, D
ef9426b8-72e5-4b87-9849-4ba32168f0df
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
1990
Farooqui, M M
1c0f9c64-a0a1-4759-a5de-492f142547ae
Leong, D
ef9426b8-72e5-4b87-9849-4ba32168f0df
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Farooqui, M M, Leong, D and Evans, A G R
(1990)
Silicon cantilevers with integral tips for atomic force microscopy.
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More information
Published date: 1990
Additional Information:
Address: Warwick
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252073
URI: http://eprints.soton.ac.uk/id/eprint/252073
PURE UUID: 09b39b2e-e5aa-4ea7-8c61-d4fe8b4b209d
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Date deposited: 09 Dec 1999
Last modified: 10 Dec 2021 20:24
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Contributors
Author:
M M Farooqui
Author:
D Leong
Author:
A G R Evans
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