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Silicon cantilevers with integral tips for atomic force microscopy

Silicon cantilevers with integral tips for atomic force microscopy
Silicon cantilevers with integral tips for atomic force microscopy
Farooqui, M M
1c0f9c64-a0a1-4759-a5de-492f142547ae
Leong, D
ef9426b8-72e5-4b87-9849-4ba32168f0df
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Farooqui, M M
1c0f9c64-a0a1-4759-a5de-492f142547ae
Leong, D
ef9426b8-72e5-4b87-9849-4ba32168f0df
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311

Farooqui, M M, Leong, D and Evans, A G R (1990) Silicon cantilevers with integral tips for atomic force microscopy.

Record type: Other

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More information

Published date: 1990
Additional Information: Address: Warwick
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252073
URI: http://eprints.soton.ac.uk/id/eprint/252073
PURE UUID: 09b39b2e-e5aa-4ea7-8c61-d4fe8b4b209d

Catalogue record

Date deposited: 09 Dec 1999
Last modified: 10 Dec 2021 20:24

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Contributors

Author: M M Farooqui
Author: D Leong
Author: A G R Evans

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