Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides
Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides
Murray, D.C.
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Carter, J.C.
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Afshar-Hanaii, N.
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Evans, A.G.R.
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Taylor, S.
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Zhang, J.
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Eccleson, W.
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1991
Murray, D.C.
2bce70f8-76ce-4693-bd84-22f43561e746
Carter, J.C.
6a4e2120-5d03-4621-9ebc-ba8901e40e7a
Afshar-Hanaii, N.
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Evans, A.G.R.
c4a3f208-8fd9-491d-870f-ce7eef943311
Taylor, S.
b4c80437-df15-44fe-beea-ec5de9f558f1
Zhang, J.
c191de5a-f35a-4e52-a86d-4fd5c31f3ff6
Eccleson, W.
36b31577-2927-44c3-b828-c8256884a781
Murray, D.C., Carter, J.C., Afshar-Hanaii, N., Evans, A.G.R., Taylor, S., Zhang, J. and Eccleson, W.
(1991)
Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides.
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Published date: 1991
Additional Information:
Address: Bristol
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252077
URI: http://eprints.soton.ac.uk/id/eprint/252077
PURE UUID: 7721b102-34bc-4789-ac57-7ff53463e7b8
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Date deposited: 09 Dec 1999
Last modified: 10 Dec 2021 20:24
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Contributors
Author:
D.C. Murray
Author:
J.C. Carter
Author:
N. Afshar-Hanaii
Author:
A.G.R. Evans
Author:
S. Taylor
Author:
J. Zhang
Author:
W. Eccleson
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