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Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides

Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides
Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides
Adam Hilger
Murray, D.C.
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Carter, J.C.
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Afshar-Hanaii, N.
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Evans, A.G.R.
c4a3f208-8fd9-491d-870f-ce7eef943311
Taylor, S.
b4c80437-df15-44fe-beea-ec5de9f558f1
Zhang, J.
c191de5a-f35a-4e52-a86d-4fd5c31f3ff6
Eccleson, W.
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Murray, D.C.
2bce70f8-76ce-4693-bd84-22f43561e746
Carter, J.C.
6a4e2120-5d03-4621-9ebc-ba8901e40e7a
Afshar-Hanaii, N.
4d2530df-e7b7-4f3f-ac49-9afe1787e1b9
Evans, A.G.R.
c4a3f208-8fd9-491d-870f-ce7eef943311
Taylor, S.
b4c80437-df15-44fe-beea-ec5de9f558f1
Zhang, J.
c191de5a-f35a-4e52-a86d-4fd5c31f3ff6
Eccleson, W.
36b31577-2927-44c3-b828-c8256884a781

Murray, D.C., Carter, J.C., Afshar-Hanaii, N., Evans, A.G.R., Taylor, S., Zhang, J. and Eccleson, W. (1991) Noise and other electrical characteristics of CMOSFETS fabricated with furnace, anodic and rapid thermal oxides.

Record type: Other

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More information

Published date: 1991
Additional Information: Address: Bristol
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252077
URI: https://eprints.soton.ac.uk/id/eprint/252077
PURE UUID: 7721b102-34bc-4789-ac57-7ff53463e7b8

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Date deposited: 09 Dec 1999
Last modified: 08 Mar 2019 17:30

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