Cantilevers with integral tips for atomic force microscopy
Cantilevers with integral tips for atomic force microscopy
Farooqui, M M
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Evans, A G R
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Stedman, M
d24a05dc-7ba0-423c-97ff-5ff971286662
Haycocks, J A
426f38bd-3a9c-4ee0-95df-e78c8d91088b
March 1991
Farooqui, M M
1c0f9c64-a0a1-4759-a5de-492f142547ae
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Stedman, M
d24a05dc-7ba0-423c-97ff-5ff971286662
Haycocks, J A
426f38bd-3a9c-4ee0-95df-e78c8d91088b
Farooqui, M M, Evans, A G R, Stedman, M and Haycocks, J A
(1991)
Cantilevers with integral tips for atomic force microscopy.
IOP Meeting on Micromachining Technology and Applications.
Record type:
Conference or Workshop Item
(Paper)
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More information
Published date: March 1991
Additional Information:
Address: London
Venue - Dates:
IOP Meeting on Micromachining Technology and Applications, 1991-03-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252078
URI: http://eprints.soton.ac.uk/id/eprint/252078
PURE UUID: f5bd98a1-d253-4342-a6b0-ae4748ecdf47
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Date deposited: 09 Dec 1999
Last modified: 07 Mar 2024 17:49
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Contributors
Author:
M M Farooqui
Author:
A G R Evans
Author:
M Stedman
Author:
J A Haycocks
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