The University of Southampton
University of Southampton Institutional Repository

Reduction of hot-electron degradation in NMOSFETS with elevated sources and drains realised by SEG of silicon using silane only

Reduction of hot-electron degradation in NMOSFETS with elevated sources and drains realised by SEG of silicon using silane only
Reduction of hot-electron degradation in NMOSFETS with elevated sources and drains realised by SEG of silicon using silane only
ESSDERC
Afshar-Nanaii, N
93b74696-c262-4e90-b795-61442235494e
Peerlings, J
8317d3a7-3b6d-47dc-85d7-96fdcbe3712a
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Carter, J C
6a4e2120-5d03-4621-9ebc-ba8901e40e7a
Afshar-Nanaii, N
93b74696-c262-4e90-b795-61442235494e
Peerlings, J
8317d3a7-3b6d-47dc-85d7-96fdcbe3712a
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Carter, J C
6a4e2120-5d03-4621-9ebc-ba8901e40e7a

Afshar-Nanaii, N, Peerlings, J, Evans, A G R and Carter, J C (1993) Reduction of hot-electron degradation in NMOSFETS with elevated sources and drains realised by SEG of silicon using silane only.

Record type: Other

This record has no associated files available for download.

More information

Published date: 1993
Additional Information: Address: Grenoble
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252435
URI: http://eprints.soton.ac.uk/id/eprint/252435
PURE UUID: 325422e5-58a9-4947-ab97-1da4387d17c0

Catalogue record

Date deposited: 28 Jan 2000
Last modified: 10 Dec 2021 20:27

Export record

Contributors

Author: N Afshar-Nanaii
Author: J Peerlings
Author: A G R Evans
Author: J C Carter

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×