Su, Y., Evans, A.G.R., Brunnschweiler, A. and Ensell, G. (1996) Fabrication of improved piezoresistive Si cantilever probe for the atomic force microscope. UK Scanned probe Microscopy Meeting, St John's College, Oxford, United Kingdom.
Record type:
Conference or Workshop Item
(Paper)
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Published date: April 1996
Additional Information:
UK Scanned probe Microscopy Meeting. Address: St Johns College, Oxford
Venue - Dates:
UK Scanned probe Microscopy Meeting, St John's College, Oxford, United Kingdom, 1996-04-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252442
URI: http://eprints.soton.ac.uk/id/eprint/252442
PURE UUID: fcfe26f9-462a-4592-b0bd-52634d017b29
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Date deposited: 28 Jan 2000
Last modified: 12 Dec 2021 06:24
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Contributors
Author:
Y. Su
Author:
A.G.R. Evans
Author:
A. Brunnschweiler
Author:
G. Ensell
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