A study of Hall and field effect mobilities in a Si/Si0.8Ge0.2 p channel MOS heterostructure
A study of Hall and field effect mobilities in a Si/Si0.8Ge0.2 p channel MOS heterostructure
Lander, R J P
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Emeleus, C J
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Parker, E H C
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Whall, T E
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Kennedy, G P
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Sidek, R
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Evans, A G R
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April 1996
Lander, R J P
e475a679-5209-49a9-82df-cd67dc331540
Emeleus, C J
b25a85e8-2664-4310-9afa-5a15dfb8da7a
Parker, E H C
e64c94b4-1029-4f6d-9ff2-6d305907f79c
Whall, T E
875dbadb-3f0d-4706-8496-19c5ab15e162
Kennedy, G P
7ee93f16-26f5-403e-9574-d22c48b69810
Sidek, R
e2534fb7-43ec-4775-9a90-c7d93b907273
Evans, A G R
c4a3f208-8fd9-491d-870f-ce7eef943311
Lander, R J P, Emeleus, C J, Parker, E H C, Whall, T E, Kennedy, G P, Sidek, R and Evans, A G R
(1996)
A study of Hall and field effect mobilities in a Si/Si0.8Ge0.2 p channel MOS heterostructure.
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Published date: April 1996
Additional Information:
MRS Spring 96 Meeting. Address: San Fransisco
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 252444
URI: http://eprints.soton.ac.uk/id/eprint/252444
PURE UUID: d8b342c3-c4f1-45aa-85b7-ade2816a6c1f
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Date deposited: 28 Jan 2000
Last modified: 10 Dec 2021 20:27
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Contributors
Author:
R J P Lander
Author:
C J Emeleus
Author:
E H C Parker
Author:
T E Whall
Author:
G P Kennedy
Author:
R Sidek
Author:
A G R Evans
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