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Radiation hardness of a bonded silicon-vacuum-silicon field effect structure with 120KGy capability

Radiation hardness of a bonded silicon-vacuum-silicon field effect structure with 120KGy capability
Radiation hardness of a bonded silicon-vacuum-silicon field effect structure with 120KGy capability
Harris, R
1d174bba-25cd-48f0-8691-684ed3612d1a
Brunnschweiler, A
2d39ef7c-b95e-476c-b435-316b6618a565
Ensell, G J
05e24f49-3922-4e5f-9aee-1e6078650579
Harris, R
1d174bba-25cd-48f0-8691-684ed3612d1a
Brunnschweiler, A
2d39ef7c-b95e-476c-b435-316b6618a565
Ensell, G J
05e24f49-3922-4e5f-9aee-1e6078650579

Harris, R, Brunnschweiler, A and Ensell, G J (1994) Radiation hardness of a bonded silicon-vacuum-silicon field effect structure with 120KGy capability.

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More information

Published date: July 1994
Additional Information: IEEE NSREC '94 Tuscon, Arizona.
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252813
URI: http://eprints.soton.ac.uk/id/eprint/252813
PURE UUID: c779882a-8d67-4a8d-9822-88e0111ff6e5

Catalogue record

Date deposited: 23 Mar 2000
Last modified: 10 Dec 2021 20:29

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Contributors

Author: R Harris
Author: A Brunnschweiler
Author: G J Ensell

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