Johnston, I R and Parker, G J (1996) Dopant Profiling of Silicon using Electrochemical Capacitance-Voltage Measurements.
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Published date: September 1996
Additional Information:
Organisation: Engineering Materials Post Graduate Conference, Chilworth Manor, Southampton 16 - 17 September 1996
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252855
URI: http://eprints.soton.ac.uk/id/eprint/252855
PURE UUID: a160fcb0-533e-46f8-8883-bdd452c40778
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Date deposited: 24 Mar 2000
Last modified: 10 Dec 2021 20:30
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Contributors
Author:
I R Johnston
Author:
G J Parker
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