Dopant Profiling of Silicon using Electrochemical Capacitance-Voltage Measurements


Johnston, I R and Parker, G J (1996) Dopant Profiling of Silicon using Electrochemical Capacitance-Voltage Measurements

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Item Type: Other
Additional Information: Organisation: Engineering Materials Post Graduate Conference, Chilworth Manor, Southampton 16 - 17 September 1996
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 252855
Date :
Date Event
September 1996Published
Date Deposited: 24 Mar 2000
Last Modified: 17 Apr 2017 23:29
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/252855

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