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Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters

Record type: Conference or Workshop Item (Other)

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Citation

Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T and Uren, M J (1997) Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters

More information

Published date: October 1997
Additional Information: Organisation: IEEE Silicon on Insulator Conference, California, USA
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252994
URI: http://eprints.soton.ac.uk/id/eprint/252994
PURE UUID: 01f3a18e-95ae-43f4-ae69-40c54bb5c84f

Catalogue record

Date deposited: 19 Apr 2000
Last modified: 18 Jul 2017 10:00

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Contributors

Author: B M Tenbroek
Author: M S L Lee
Author: W Redman-White
Author: R J T Bunyan
Author: M J Uren

University divisions


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