Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T and Uren, M J (1997) Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters.
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Published date: October 1997
Additional Information:
Organisation: IEEE Silicon on Insulator Conference, California, USA
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252994
URI: http://eprints.soton.ac.uk/id/eprint/252994
PURE UUID: 01f3a18e-95ae-43f4-ae69-40c54bb5c84f
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Date deposited: 19 Apr 2000
Last modified: 10 Dec 2021 20:31
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Contributors
Author:
B M Tenbroek
Author:
M S L Lee
Author:
W Redman-White
Author:
R J T Bunyan
Author:
M J Uren
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