Measurement and simulation of self-heating in SOI CMOS analogue circuits
Measurement and simulation of self-heating in SOI CMOS analogue circuits
Tenbroek, B M
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Lee, M S L
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Redman-White, W
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Bunyan, R J T
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Edwards, C F
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Uren, M J
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October 1997
Tenbroek, B M
d7af4b47-9b03-4a16-bac2-f30d4c063643
Lee, M S L
bafc771f-3562-4a77-a7cc-20326d2ba792
Redman-White, W
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Bunyan, R J T
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Edwards, C F
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Uren, M J
a01d904d-14a4-42f0-a027-631e4e37d4bf
Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T, Edwards, C F and Uren, M J
(1997)
Measurement and simulation of self-heating in SOI CMOS analogue circuits.
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Published date: October 1997
Additional Information:
Organisation: IEEE Silicon on Insulator Conference, California, USA
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 252995
URI: http://eprints.soton.ac.uk/id/eprint/252995
PURE UUID: 42fcbb1b-82cb-4636-a007-ec7995e2d297
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Date deposited: 19 Apr 2000
Last modified: 07 Jan 2022 21:09
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Contributors
Author:
B M Tenbroek
Author:
M S L Lee
Author:
W Redman-White
Author:
R J T Bunyan
Author:
C F Edwards
Author:
M J Uren
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