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Measurement and simulation of self-heating in SOI CMOS analogue circuits

Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T, Edwards, C F and Uren, M J (1997) Measurement and simulation of self-heating in SOI CMOS analogue circuits

Record type: Conference or Workshop Item (Other)

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Published date: October 1997
Additional Information: Organisation: IEEE Silicon on Insulator Conference, California, USA
Organisations: Nanoelectronics and Nanotechnology


Local EPrints ID: 252995
PURE UUID: 42fcbb1b-82cb-4636-a007-ec7995e2d297

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Date deposited: 19 Apr 2000
Last modified: 18 Jul 2017 10:00

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Author: B M Tenbroek
Author: M S L Lee
Author: W Redman-White
Author: R J T Bunyan
Author: C F Edwards
Author: M J Uren

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