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Measurement and simulation of self-heating in SOI CMOS analogue circuits

Measurement and simulation of self-heating in SOI CMOS analogue circuits
Measurement and simulation of self-heating in SOI CMOS analogue circuits
Tenbroek, B M
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Lee, M S L
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Redman-White, W
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Bunyan, R J T
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Edwards, C F
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Uren, M J
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Tenbroek, B M
d7af4b47-9b03-4a16-bac2-f30d4c063643
Lee, M S L
bafc771f-3562-4a77-a7cc-20326d2ba792
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Bunyan, R J T
d9a64ca6-7cb9-4eba-8afa-294fe386aed0
Edwards, C F
abf3541b-e757-47ca-a5dd-3a6e65e75d5d
Uren, M J
a01d904d-14a4-42f0-a027-631e4e37d4bf

Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T, Edwards, C F and Uren, M J (1997) Measurement and simulation of self-heating in SOI CMOS analogue circuits.

Record type: Conference or Workshop Item (Other)

Full text not available from this repository.

More information

Published date: October 1997
Additional Information: Organisation: IEEE Silicon on Insulator Conference, California, USA
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 252995
URI: https://eprints.soton.ac.uk/id/eprint/252995
PURE UUID: 42fcbb1b-82cb-4636-a007-ec7995e2d297

Catalogue record

Date deposited: 19 Apr 2000
Last modified: 16 Jul 2019 23:05

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