Measurement and simulation of self-heating in SOI CMOS analogue circuits


Tenbroek, B M, Lee, M S L, Redman-White, W, Bunyan, R J T, Edwards, C F and Uren, M J (1997) Measurement and simulation of self-heating in SOI CMOS analogue circuits

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Item Type: Conference or Workshop Item (Other)
Additional Information: Organisation: IEEE Silicon on Insulator Conference, California, USA
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 252995
Date :
Date Event
October 1997Published
Date Deposited: 19 Apr 2000
Last Modified: 17 Apr 2017 23:27
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/252995

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