Tenbroek, B M, Redman-White, W, Lee, M S L and Uren, M J (1995) Comparison of SOI MOSFET self-heating measurements by gate resistance thermometry and small-signal drain admittance extraction.
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Conference or Workshop Item
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Published date: October 1995
Additional Information:
Organisation: Proc IEEE International SOI Conference, Tucson, AZ, USA
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 253003
URI: http://eprints.soton.ac.uk/id/eprint/253003
PURE UUID: b603ac23-a375-4f10-b313-10b3d396bf1d
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Date deposited: 19 Apr 2000
Last modified: 10 Dec 2021 20:31
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Contributors
Author:
B M Tenbroek
Author:
W Redman-White
Author:
M S L Lee
Author:
M J Uren
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