Tenbroek, B M, Redman-White, W, Lee, M S L and Uren, M J (1995) Experimental validation of simple electrothermal circuit models for SOI MOSFETs using direct DC-UHF measurement of drain admittance.
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Published date: September 1995
Additional Information:
Organisation: Proc European Solid State Device Research Conference, The Hague, The Netherlands
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 253006
URI: http://eprints.soton.ac.uk/id/eprint/253006
PURE UUID: 74e875bb-e58d-4370-8f5c-8c0499c96df5
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Date deposited: 19 Apr 2000
Last modified: 10 Dec 2021 20:31
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Contributors
Author:
B M Tenbroek
Author:
W Redman-White
Author:
M S L Lee
Author:
M J Uren
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