Redman-White, W, Lee, M S L, Uren, M J and Tenbroek, B M (1993) Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs.
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Conference or Workshop Item
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Published date: August 1993
Additional Information:
Organisation: Proc. European Conf. on Circuit Theory and Design, Davos, Switzerland
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 253021
URI: http://eprints.soton.ac.uk/id/eprint/253021
PURE UUID: d7483943-d212-45c4-b5c9-75f486f21a2d
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Date deposited: 26 Apr 2000
Last modified: 10 Dec 2021 20:31
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Contributors
Author:
W Redman-White
Author:
M S L Lee
Author:
M J Uren
Author:
B M Tenbroek
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