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Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs

Redman-White, W, Lee, M S L, Uren, M J and Tenbroek, B M (1993) Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs

Record type: Conference or Workshop Item (Other)

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Published date: August 1993
Additional Information: Organisation: Proc. European Conf. on Circuit Theory and Design, Davos, Switzerland
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 253021
URI: http://eprints.soton.ac.uk/id/eprint/253021
PURE UUID: d7483943-d212-45c4-b5c9-75f486f21a2d

Catalogue record

Date deposited: 26 Apr 2000
Last modified: 18 Jul 2017 10:00

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Contributors

Author: W Redman-White
Author: M S L Lee
Author: M J Uren
Author: B M Tenbroek

University divisions

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