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Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs

Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs
Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Lee, M S L
bafc771f-3562-4a77-a7cc-20326d2ba792
Uren, M J
a01d904d-14a4-42f0-a027-631e4e37d4bf
Tenbroek, B M
d7af4b47-9b03-4a16-bac2-f30d4c063643
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Lee, M S L
bafc771f-3562-4a77-a7cc-20326d2ba792
Uren, M J
a01d904d-14a4-42f0-a027-631e4e37d4bf
Tenbroek, B M
d7af4b47-9b03-4a16-bac2-f30d4c063643

Redman-White, W, Lee, M S L, Uren, M J and Tenbroek, B M (1993) Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs.

Record type: Conference or Workshop Item (Other)

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More information

Published date: August 1993
Additional Information: Organisation: Proc. European Conf. on Circuit Theory and Design, Davos, Switzerland
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 253021
URI: https://eprints.soton.ac.uk/id/eprint/253021
PURE UUID: d7483943-d212-45c4-b5c9-75f486f21a2d

Catalogue record

Date deposited: 26 Apr 2000
Last modified: 18 Jul 2017 10:00

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