Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs


Redman-White, W, Lee, M S L, Uren, M J and Tenbroek, B M (1993) Characterisation and modelling of circuit level electrical and thermal behaviour of SOI MOSFETs

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Item Type: Conference or Workshop Item (Other)
Additional Information: Organisation: Proc. European Conf. on Circuit Theory and Design, Davos, Switzerland
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 253021
Date :
Date Event
August 1993Published
Date Deposited: 26 Apr 2000
Last Modified: 17 Apr 2017 23:26
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/253021

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