Howes, R. and Redman-White, W. (1991) Frequency dependent small-signal drain characteristics in silicon-on-sapphire MOSFETs. In, Proceedings of the European Solid State Device Research Conference. European Solid State Device Research Conference (01/09/91)
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Published date: September 1991
Venue - Dates:
European Solid State Device Research Conference, , Montreux, Switzerland, 1991-09-01
Organisations:
Nanoelectronics and Nanotechnology
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Local EPrints ID: 253258
URI: http://eprints.soton.ac.uk/id/eprint/253258
PURE UUID: f9ea2a42-29a4-4e94-8a2e-177bd1999766
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Date deposited: 09 May 2000
Last modified: 12 Dec 2021 03:21
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Contributors
Author:
R. Howes
Author:
W. Redman-White
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