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Frequency dependent small-signal drain characteristics in silcon-on-sapphire MOSFETs

Howes, R and Redman-White, W (1991) Frequency dependent small-signal drain characteristics in silcon-on-sapphire MOSFETs

Record type: Conference or Workshop Item (Other)

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Published date: September 1991
Additional Information: Organisation: Proc European Solid State Device Research Conference, Montreaux, Switzerland
Organisations: Nanoelectronics and Nanotechnology

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Local EPrints ID: 253258
URI: http://eprints.soton.ac.uk/id/eprint/253258
PURE UUID: f9ea2a42-29a4-4e94-8a2e-177bd1999766

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Date deposited: 09 May 2000
Last modified: 18 Jul 2017 09:59

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Contributors

Author: R Howes
Author: W Redman-White

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