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A charge conserving SOS MOSFET model including radiation effects for circuit simulation

Record type: Conference or Workshop Item (Other)

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Citation

Howes, R, Redman-White, W, Nicols, K G, Bird, S, Robinson, M and Mole, P J (1991) A charge conserving SOS MOSFET model including radiation effects for circuit simulation

More information

Published date: September 1991
Additional Information: Organisation: Proc Conference on Radiation Effects on Components and Semiconductors, Montpelier, France
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 253262
URI: http://eprints.soton.ac.uk/id/eprint/253262
PURE UUID: 94e6fa4c-0f3c-41a9-981e-f2b2d17e77ca

Catalogue record

Date deposited: 05 May 2000
Last modified: 18 Jul 2017 09:59

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Contributors

Author: R Howes
Author: W Redman-White
Author: K G Nicols
Author: S Bird
Author: M Robinson
Author: P J Mole

University divisions


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