Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Redman-White, W, Carter, J C and Altrip, J L (1989) Increased low frequency noise generating defects in today's CMOS/BiCMOS technologies. European Materials Research Society Spring Meeting (E-MRS 1989), , Strasbourg, France. 30 May - 02 Jun 1989.
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Conference or Workshop Item
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Published date: May 1989
Venue - Dates:
European Materials Research Society Spring Meeting (E-MRS 1989), , Strasbourg, France, 1989-05-30 - 1989-06-02
Organisations:
Nanoelectronics and Nanotechnology, Southampton Wireless Group
Identifiers
Local EPrints ID: 253271
URI: http://eprints.soton.ac.uk/id/eprint/253271
PURE UUID: 7e2d689f-113d-4b3e-b159-e38d7d9d8eee
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Date deposited: 09 May 2000
Last modified: 27 Jul 2023 15:00
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Contributors
Author:
D C Murray
Author:
N Siabi-Shahrivar
Author:
A G R Evans
Author:
W Redman-White
Author:
J C Carter
Author:
J L Altrip
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