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Increased low frequency noise generating defects in today's CMOS/BICMOS technologies

Record type: Conference or Workshop Item (Paper)

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Citation

Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Redman-White, W, Carter, J C and Altrip, J L (1989) Increased low frequency noise generating defects in today's CMOS/BICMOS technologies At European Materials Research Conference, France.

More information

Published date: May 1989
Venue - Dates: European Materials Research Conference, France, 1989-05-01
Organisations: Nanoelectronics and Nanotechnology, Southampton Wireless Group

Identifiers

Local EPrints ID: 253271
URI: http://eprints.soton.ac.uk/id/eprint/253271
PURE UUID: 7e2d689f-113d-4b3e-b159-e38d7d9d8eee

Catalogue record

Date deposited: 09 May 2000
Last modified: 18 Jul 2017 09:59

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Contributors

Author: D C Murray
Author: N Siabi-Shahrivar
Author: A G R Evans
Author: W Redman-White
Author: J C Carter
Author: J L Altrip

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