Increased low frequency noise generating defects in today's CMOS/BICMOS technologies


Murray, D C, Siabi-Shahrivar, N, Evans, A G R, Redman-White, W, Carter, J C and Altrip, J L (1989) Increased low frequency noise generating defects in today's CMOS/BICMOS technologies At European Materials Research Conference, France.

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Item Type: Conference or Workshop Item (Paper)
Venue - Dates: European Materials Research Conference, France, 1989-05-01
Organisations: Nanoelectronics and Nanotechnology, Southampton Wireless Group
ePrint ID: 253271
Date :
Date Event
May 1989Published
Date Deposited: 09 May 2000
Last Modified: 17 Apr 2017 23:25
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/253271

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