Redman-White, W, Lee, M S L, Tenbroek, B M, Uren, M J and Bunyan, R J T (1993) Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements. Electronics Letters, 29 (13), 1180-1181.
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Published date: June 1993
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 253297
URI: http://eprints.soton.ac.uk/id/eprint/253297
ISSN: 0013-5194
PURE UUID: 04260ae3-cbc9-49be-bb88-0c8358412d9a
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Date deposited: 08 May 2000
Last modified: 10 Dec 2021 20:32
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Contributors
Author:
W Redman-White
Author:
M S L Lee
Author:
B M Tenbroek
Author:
M J Uren
Author:
R J T Bunyan
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