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Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements

Redman-White, W, Lee, M S L, Tenbroek, B M, Uren, M J and Bunyan, R J T (1993) Direct extraction of MOSFET dynamic thermal characteristics from standard transistor structures using small signal measurements Electronics Letters, 29, (13), pp. 1180-1181.

Record type: Article

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Published date: June 1993
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 253297
URI: http://eprints.soton.ac.uk/id/eprint/253297
ISSN: 0013-5194
PURE UUID: 04260ae3-cbc9-49be-bb88-0c8358412d9a

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Date deposited: 08 May 2000
Last modified: 11 Jul 2017 09:51

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Contributors

Author: W Redman-White
Author: M S L Lee
Author: B M Tenbroek
Author: M J Uren
Author: R J T Bunyan

University divisions

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