Howes, R and Redman-White, W (1991) Measurement and analysis of small-signal drain admittance in SOS MOSFETs. Electronics Letters, 27 (24), 2290-2292.
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Published date: November 1991
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 253298
URI: http://eprints.soton.ac.uk/id/eprint/253298
ISSN: 0013-5194
PURE UUID: 2c119cd1-50c4-47a8-8c21-6b28ff4a7c78
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Date deposited: 08 May 2000
Last modified: 10 Dec 2021 20:32
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Author:
R Howes
Author:
W Redman-White
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