Measurement and analysis of small-signal drain admittance in SOS MOSFETs


Howes, R and Redman-White, W (1991) Measurement and analysis of small-signal drain admittance in SOS MOSFETs Electronics Letters, 27, (24), pp. 2290-2292.

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Item Type: Article
ISSNs: 0013-5194 (print)
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 253298
Date :
Date Event
November 1991Published
Date Deposited: 08 May 2000
Last Modified: 17 Apr 2017 23:25
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/253298

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