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Measurement and analysis of small-signal drain admittance in SOS MOSFETs

Howes, R and Redman-White, W (1991) Measurement and analysis of small-signal drain admittance in SOS MOSFETs Electronics Letters, 27, (24), pp. 2290-2292.

Record type: Article

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Published date: November 1991
Organisations: Nanoelectronics and Nanotechnology

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Local EPrints ID: 253298
URI: http://eprints.soton.ac.uk/id/eprint/253298
ISSN: 0013-5194
PURE UUID: 2c119cd1-50c4-47a8-8c21-6b28ff4a7c78

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Date deposited: 08 May 2000
Last modified: 18 Jul 2017 09:59

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Contributors

Author: R Howes
Author: W Redman-White

University divisions

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