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Measurement and analysis of small-signal drain admittance in SOS MOSFETs

Measurement and analysis of small-signal drain admittance in SOS MOSFETs
Measurement and analysis of small-signal drain admittance in SOS MOSFETs
0013-5194
2290-2292
Howes, R
e00663fa-4ea2-4ae1-bff5-4ac9078f492f
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Howes, R
e00663fa-4ea2-4ae1-bff5-4ac9078f492f
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf

Howes, R and Redman-White, W (1991) Measurement and analysis of small-signal drain admittance in SOS MOSFETs. Electronics Letters, 27 (24), 2290-2292.

Record type: Article

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More information

Published date: November 1991
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 253298
URI: https://eprints.soton.ac.uk/id/eprint/253298
ISSN: 0013-5194
PURE UUID: 2c119cd1-50c4-47a8-8c21-6b28ff4a7c78

Catalogue record

Date deposited: 08 May 2000
Last modified: 18 Jul 2017 09:59

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