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Impact of self-heating and thermal coupling on analogue circuits in SOI CMOS

Impact of self-heating and thermal coupling on analogue circuits in SOI CMOS
Impact of self-heating and thermal coupling on analogue circuits in SOI CMOS
This paper examines the influence of the static and dynamic electrothermal behaviour of silicon-on-insulaotr (SOI) CMOS transistors on a range of primitive analog circuit cells. In addition to the more well-known self-heating close-range thermal coupling effects are also examined. Particular emphasis is given to the impact of these effects on drain current mismatch due to localized temperature differences. Dynamic electrothermal behaviour in the time and frequency domains is also considered, measurements and analyses are presented for a simple amplifier stage, current mirrors, a current output D/A converter, and ring oscillators fabricated in a 0.7-um SOI CMOS process. It is shown that circuits which rely strongly on matching, such as the current mirrors or D/A converter, are significantly affected by self-heating and thermal coupling. Anomalies due to self-heating are also clearly visible in the small-signal characteristics of the amplifier stage. Self-heating effects are less significant for fast switching circuits. The paper demonstrates how circuit-level simulations can be used to predict undesirable nonisothermal operating conditions during the design stage.
0018-9200
1037-1046
Tenbroek, B. M.
321ed915-008d-4218-9564-57e061886804
Redman-White, W.
d5376167-c925-460f-8e9c-13bffda8e0bf
Lee, M. S. L.
6460a2db-498f-49de-b52e-9c134b9cf54d
Bunyan, R. J. T.
f87a3069-9adc-4e66-93ab-858ebb39045b
Uren, M. J.
98cd13fc-b6fa-4126-8ef3-f5fc8be04710
Tenbroek, B. M.
321ed915-008d-4218-9564-57e061886804
Redman-White, W.
d5376167-c925-460f-8e9c-13bffda8e0bf
Lee, M. S. L.
6460a2db-498f-49de-b52e-9c134b9cf54d
Bunyan, R. J. T.
f87a3069-9adc-4e66-93ab-858ebb39045b
Uren, M. J.
98cd13fc-b6fa-4126-8ef3-f5fc8be04710

Tenbroek, B. M., Redman-White, W., Lee, M. S. L., Bunyan, R. J. T. and Uren, M. J. (1998) Impact of self-heating and thermal coupling on analogue circuits in SOI CMOS. IEEE Journal of Solid State Circuits, 33 (7), 1037-1046.

Record type: Article

Abstract

This paper examines the influence of the static and dynamic electrothermal behaviour of silicon-on-insulaotr (SOI) CMOS transistors on a range of primitive analog circuit cells. In addition to the more well-known self-heating close-range thermal coupling effects are also examined. Particular emphasis is given to the impact of these effects on drain current mismatch due to localized temperature differences. Dynamic electrothermal behaviour in the time and frequency domains is also considered, measurements and analyses are presented for a simple amplifier stage, current mirrors, a current output D/A converter, and ring oscillators fabricated in a 0.7-um SOI CMOS process. It is shown that circuits which rely strongly on matching, such as the current mirrors or D/A converter, are significantly affected by self-heating and thermal coupling. Anomalies due to self-heating are also clearly visible in the small-signal characteristics of the amplifier stage. Self-heating effects are less significant for fast switching circuits. The paper demonstrates how circuit-level simulations can be used to predict undesirable nonisothermal operating conditions during the design stage.

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More information

Published date: May 1998
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 253302
URI: https://eprints.soton.ac.uk/id/eprint/253302
ISSN: 0018-9200
PURE UUID: 5fcff607-2734-4f2e-96d0-49d72de7a5b0

Catalogue record

Date deposited: 09 Sep 2004
Last modified: 18 Jul 2017 09:59

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