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The measurement of space charge trapping characteristics in high voltage insulation materials.

The measurement of space charge trapping characteristics in high voltage insulation materials.
The measurement of space charge trapping characteristics in high voltage insulation materials.
46-9
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Davies, A.E.
56d95222-b259-494a-92e9-68b090ec0dcd
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Ford, M.J.
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Swingler, S.
3f3efe40-ce1a-4de1-853a-a25ef2730c0e
Patel, D.
c8d09f57-2b67-442c-aff3-30deb23f6fcb
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Davies, A.E.
56d95222-b259-494a-92e9-68b090ec0dcd
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Ford, M.J.
c72893ca-2f5e-407e-886a-d7685044ab3b
Swingler, S.
3f3efe40-ce1a-4de1-853a-a25ef2730c0e
Patel, D.
c8d09f57-2b67-442c-aff3-30deb23f6fcb

Lewin, P.L., Davies, A.E., Chen, G., Ford, M.J., Swingler, S. and Patel, D. (1996) The measurement of space charge trapping characteristics in high voltage insulation materials. 7th Intn. Conference on Dielectric Materials, Measurements and Applications. pp. 46-9 .

Record type: Conference or Workshop Item (Other)

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Published date: September 1996
Venue - Dates: 7th Intn. Conference on Dielectric Materials, Measurements and Applications, 1996-09-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 253585
URI: https://eprints.soton.ac.uk/id/eprint/253585
PURE UUID: e64feb39-85ca-421c-ae70-03761f29fbe3

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Date deposited: 26 Jun 2003
Last modified: 18 Jul 2017 09:57

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