Lewin, P.L. (1998) Measurement of surface charge using the Pockels effect. (Invited Paper). IEE Colloquium (98/235) Surface Phenomena Affecting Insulator Performance.. pp. 1-3 .
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Published date: January 1998
Additional Information:
Chapter: 8 Organisation: IEE
Venue - Dates:
IEE Colloquium (98/235) Surface Phenomena Affecting Insulator Performance., 1998-01-01
Organisations:
Electronics & Computer Science, EEE
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Local EPrints ID: 253586
URI: http://eprints.soton.ac.uk/id/eprint/253586
PURE UUID: ab2f9c9f-a1af-4dd9-b712-f2213d38c6d2
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Date deposited: 26 Jun 2003
Last modified: 11 Dec 2021 02:52
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Author:
P.L. Lewin
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