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Measurement of surface charge using the Pockels effect. (Invited Paper)

Measurement of surface charge using the Pockels effect. (Invited Paper)
Measurement of surface charge using the Pockels effect. (Invited Paper)
1-3
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e

Lewin, P.L. (1998) Measurement of surface charge using the Pockels effect. (Invited Paper). IEE Colloquium (98/235) Surface Phenomena Affecting Insulator Performance.. pp. 1-3 .

Record type: Conference or Workshop Item (Other)

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More information

Published date: January 1998
Additional Information: Chapter: 8 Organisation: IEE
Venue - Dates: IEE Colloquium (98/235) Surface Phenomena Affecting Insulator Performance., 1998-01-01
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 253586
URI: https://eprints.soton.ac.uk/id/eprint/253586
PURE UUID: ab2f9c9f-a1af-4dd9-b712-f2213d38c6d2

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Date deposited: 26 Jun 2003
Last modified: 18 Jul 2017 09:57

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