The University of Southampton
University of Southampton Institutional Repository

BIST Hardware Synthesis for RTL Data Paths Based on Test Compatibility Classes

Nicolici, N., Al-Hashimi, B.M., Brown, A.D. and Williams, A.C. (2000) BIST Hardware Synthesis for RTL Data Paths Based on Test Compatibility Classes IEEE Transactions on CAD, 19, (11), pp. 1375-1385.

Record type: Article

Abstract

New BIST methodology for RTL data paths is presented. The proposed BIST methodology takes advantage of the structural information of RTL data path and reduces the test application time by grouping same-type modules into test compatibility classes (TCCs). During testing, compatible modules share a small number of test pattern generators at the same test time leading to significant reductions in BIST area overhead, performance degradation and test application time. Module output responses from each TCC are checked by comparators leading to substantial reduction in fault-escape probability. Only a single signature analysis register is required to compress the responses of each TCC which leads to high reductions in volume of output data and overall test application time (the sum of test application time and shifting time required to shift out test responses). This paper shows how the proposed TCC grouping methodology is a general case of the traditional BIST embedding methodology for RTL data paths with both uniform and variable bit width. A new BIST hardware synthesis algorithm employs efficient tabu search-based testable design space exploration which combines the accuracy of incremental test scheduling algorithms and the exploration speed of test scheduling algorithms based on fixed test resource allocation. To illustrate TCC grouping methodology efficiency, various benchmark and complex hypothetical data paths have been evaluated and significant improvements over BIST embedding methodology are achieved.

PDF ieeetcad00.pdf - Other
Download (145kB)

More information

Published date: November 2000
Organisations: Electronic & Software Systems, EEE

Identifiers

Local EPrints ID: 253684
URI: http://eprints.soton.ac.uk/id/eprint/253684
PURE UUID: 72ba0aa9-efd1-4179-8597-9234718e0646

Catalogue record

Date deposited: 29 May 2001
Last modified: 18 Jul 2017 09:56

Export record

Contributors

Author: N. Nicolici
Author: B.M. Al-Hashimi
Author: A.D. Brown
Author: A.C. Williams

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×